Transmission/reflection and short-circuit line methods for measuring permittivity and permeability
J Baker-Jarvis, MD Janezic… - Nasa Sti/recon …, 1992 - ui.adsabs.harvard.edu
The transmission/reflection and short-circuit line methods for measuring complex permittivity
and permeability of materials in waveguides and coaxial lines are examined. Equations for …
and permeability of materials in waveguides and coaxial lines are examined. Equations for …
Complex permittivity determination from propagation constant measurements
MD Janezic, JA Jargon - IEEE microwave and guided wave …, 1999 - ieeexplore.ieee.org
The authors present a new transmission line method for measuring the complex permittivity
of dielectric materials using propagation constant measurements. In contrast to previous …
of dielectric materials using propagation constant measurements. In contrast to previous …
Analysis of an open-ended coaxial probe with lift-off for nondestructive testing
J Baker-Jarvis, MD Janezic… - IEEE Transactions on …, 1994 - ieeexplore.ieee.org
… Janezic is a meml … Janezic (M’91) received the BS degree in electrical engineering from
the University of Colorado in 1991. He is currently working on the MS degree, specializing in …
the University of Colorado in 1991. He is currently working on the MS degree, specializing in …
Dielectric characterization of low-loss materials a comparison of techniques
…, RG Geyer, JH Grosvenor, MD Janezic… - … on Dielectrics and …, 1998 - ieeexplore.ieee.org
Measurements on low-loss materials using closed and open cavity resonators, and dielectric
resonator methods are presented. Results indicate that consistent measurement results …
resonator methods are presented. Results indicate that consistent measurement results …
Full-wave analysis of a split-cylinder resonator for nondestructive permittivity measurements
MD Janezic, J Baker-Jarvis - IEEE Transactions on microwave …, 1999 - ieeexplore.ieee.org
… Janezic (S’93–M’95) received the BS degree in electrical engineering, the Masters degree
from the University of Colorado at Boulder, in 1991 and 1996, respectively, and is currently …
from the University of Colorado at Boulder, in 1991 and 1996, respectively, and is currently …
Quantitative permittivity measurements of nanoliter liquid volumes in microfluidic channels to 40 GHz
…, J Mateu, M Janezic, M Rinehart… - IEEE Transactions …, 2010 - ieeexplore.ieee.org
We describe the design, fabrication, and evaluation of a new on-wafer measurement platform
for the rapid and quantitative determination of the complex permittivity of nanoliter fluid …
for the rapid and quantitative determination of the complex permittivity of nanoliter fluid …
High-frequency dielectric measurements
J Baker-Jarvis, MD Janezic… - IEEE Instrumentation & …, 2010 - ieeexplore.ieee.org
The demands on dielectric material measurements have increased over the years as electrical
components have been miniaturized and device frequency bands have increased. Well-…
components have been miniaturized and device frequency bands have increased. Well-…
[PDF][PDF] Dielectric and conductor-loss characterization and measurements on electronic packaging materials
MD Janezic, N Paulter, J Blendell - NIST Technical note, 2001 - tsapps.nist.gov
This technical note is an introductory overview of dielectric and magnetic measurement
metrology on packaging materials. Dielectric materials have many important functions in the …
metrology on packaging materials. Dielectric materials have many important functions in the …
Intercomparison of permittivity measurements using the transmission/reflection method in 7-mm coaxial transmission lines
…, JH Grosvenor, MD Janezic - IEEE Transactions …, 1994 - ieeexplore.ieee.org
… Sample kit 3 contains a fifth, higher-permittivity specimen with 6; M 50. The materials which
make up the specimens were not disclosed to the intercomparison participants, and are …
make up the specimens were not disclosed to the intercomparison participants, and are …
Permittivity characterization of low-k thin films from transmission-line measurements
MD Janezic, DF Williams, V Blaschke… - IEEE Transactions …, 2003 - ieeexplore.ieee.org
… , where is the speed of light and is the angular frequency of the signal of four planar microstrip
lines with center conductor widths of 4.97, 0.56, 0.43, and 0.36 m that we fabricated on a …
lines with center conductor widths of 4.97, 0.56, 0.43, and 0.36 m that we fabricated on a …